Germany: 2nd Conference on Optical Characterization of Materials
The International Conference on Optical Characterization of Materials (OCM-2015) is organized by the Karlsruhe Center for Spectral Signatures of Materials (KCM) in cooperation with the German Chapter of the Instrumentation & Measurement Society of IEEE. KCM is an association of institutes belonging to the Karlsruhe Institute for Technology (KIT) and the business unit, Automated Visual Inspection, which is part of the Fraunhofer Institute of Optronics, System Technologies and Image Exploitation (Fraunhofer IOSB).
During the conference, trends and developments in material characterization will be discussed. Other topics include the latest highlight with regard to identifying spectral footprints and their industrial implementation.
Professor Kessler from Reutlingen will be holding a keynote speech at the beginning of the conference. His lecture will deal with the advantages and disadvantages of various optical spectroscopy techniques. We expect this to increasingly take on a more important role within the field of the sensor technology, seeing that it provides chemical and morphological information simultaneously.
The conference topics will include the following:
• Food Inspection
• Plastics Recycling
• Waste Recycling • Industrial Solutions
• Spectral Data Processing
• Mineral Sorting
Details can be found in the conference program at: www.OCM-2015.eu