Technological advancements (i.e., HD cameras, LED lighting, increased processing speed, etc.) have enabled a improvement in the apple grading technology over the past 10 years. This applies especially to the grading of external defect capabilities.
The Ellips apple defect system is one of the most accurate defect systems in the world. By adding Bruising and Stem Split the performance of the system has increased further.
The Ellips apple defect system is:
- easy to use without the need to train the system;
- able to detect most of the prevalent external defects (i.e., bruises, limb rub, russet, bird peck, bitter pit, flecking and punctures);
- accurate in detecting bruising, even on red apples;
- tracking the defect over multiple images. This avoids multiple count of the same defect and is a strong and unique aspect of the system.
Competitive systems lack this accuracy because they count one and the same defect multiple times. Depending on the amount of images showing the defect, one defect can be falsely counted up to 8 times. Resulting in the loss of good crop.
While the use of HD cameras enables better visual identification of defects, it also creates massive amounts of data. Ellips has addressed this with increased processing power and more sophisticated software algorithms in order to make it beneficial.
Stem bowl crack detection is one of these defects where high resolution is needed.
Ellips are at Fruit Logistica, 3,4,5 February 2016, Berlin. Hall 6.1 A-03
For more information, please visit www.ellips.com.